- Potential factors like economic disruption due to COVID-19, working from home, wafer yield issues, and shortage for 200 mm wafer capacities in foundries are some of the potential reasons why we are seeing a sudden surge in demand and a severe shortage in supply.
- Over the last 30 years, silicon wafer size has grown from 1-inch to 300 mm wafer size (which is 11.8 times larger than 1 inch). 300 mm wafers are invariably used for manufacturing leading-edge silicon IC’s, but this doesn’t benefit many customers.
- The reason being these design companies don’t see much profitability in lower node technologies and hence they want to continue with their current fab.
- 200 mm (8-inch in diameter) fabs are older facilities that manufacture chips at mature nodes (350 nm to 90 nm), whereas 300 mm fabs are used for manufacturing chips designed on lower nodes (65 nm and below), but it is not restricted just to lower nodes.
- Moving design from one fab to another incur huge cost.
- Since many people are working from home, there is a huge demand for computers, tablets, TV, Wi-Fi, Bluetooth, and many automotive electronics. And the current fab capacity limit is making it difficult to meet the supply request.
- The semiconductor industry is at a critical juncture where the demand from general household and partner companies is shooting up with a huge potential for revenue generation in 2021 (at least 12% growth), but at the same time, the supply chain is in the spotlight restricted by limited capability and lower investment.
VLSI Digest
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Wednesday, April 7, 2021
Why there is a massive chip shortage in the semiconductor industry?
Tuesday, April 6, 2021
Sunday, April 4, 2021
Micron Rules and Lambda Design rules
Micron Rules: This specifies the layout constraints such as minimum feature sizes and minimum feature separations in terms of absolute dimensions.
Lambda Rules: This specifies the layout constraints in terms of a single parameter (𝝀) and thus allows linear and proportional scaling of all geometrical constraints.
Example:- Minimum Poly width: 4𝝀
Tuesday, September 8, 2020
Types of element?
1. Active and Passive element:
Active devices are the one which generates (or) amplify (or) rectify any signals (Voltage source, Current source, Diode, Transistor, DIAC, SCR, Op-Amp, etc)
Rest all devices are called a passive device (R, L, C, Transformer).
Note: Amplification here is in terms of the power signal and hence transformer cannot be put under the category of the active device as the power is constant in both the primary and secondary side of the transformer (I1V1 = I2V2).
2. Linear and Non-Linear:
Linear devices are the one which obeys the law of superposition and homogeneity.
(Or) To put this simply, any straight line passing through the origin is called a linear element (R, L, C).
Non-linear element examples are diode, SCR, DIAC, etc.
3. Bilateral and Unilateral:
Any bilateral element (e.g. R, DIAC) will have similar characteristics in the 1st and 3rd quadrant of the graph else it will be a unilateral element (e.g. Diode).
4. Time-Variant and Time-Invariant
5. Lumped and Distributed
Let's understand these concepts on a graph (I vs V):-
Latch-Up Effect?
As can be seen in the above snapshot, resistance connected to the bases of NPN transistors and collectors of the PNP transistors greatly influences both ESD and Latch-Up effect in the layout. Furthermore, latch-up is sensitive to layout and hence most often solved at the layout level when doing the physical implementation of the design.
What is latch-up?
Latch-up is the creation of low impedance path between the power supply rails (e.g. vdd to gnd in the above case). It is caused when the parasitic BJT structures within an IC are triggered when a current/voltage is applied as stimulus in the input, output or I/O pin.
Sometime it also happen that the latch-up occur only while the pulse stimulus is connected to the IC and returns back to normal level once the stimulus is removed. Such an effect is called temporary (or) transient latch-up.
While a true latch-up is a one which remains even after the stimulus is removed. In such scenarios to remove the low impedance path between the power rails, a power supply shutdown is required.
How does it occur?
Latch-up is a regenerative process that occur when a pnpn structure (aka silicon controlled rectifier (SCR)) is formed. It is composed of parasitic npn and pnp transistor.
To avoid latch-up:
- Vpnpn <= Vs (Sustaining Voltage)
- Injecting current < Holding current (IH)
- Surround the transistor with guard rings.
- Reduce Rn and Rp. This will cause more current requirement for latch-up to occur.
Guard rings are used to collect majority (or) minority carriers flowing in the silicon. Tuning the doping level of the guard ring material helps in increasing or decreasing the resistance in the area of guard ring.
Wednesday, September 2, 2020
Shallow Trench Isolation (STI)
- Isolation technique to prevent current leakage between adjacent semiconductor device.
- Hence, prevents latch-up.
- MOSFET's are also called self-isolating devices but as the transistor size decreases the use of reverse bias pn-junction to isolate transistor becomes impractical.
- STI allows closer spacing of transistors.
- In scenarios as n+ & p+ spacing gets smaller, birds beak shape characteristic is formed which leads to undesirable stress effects in the transistor.
- STI has the advantage of minimizing the heat cycle needed for n+ and p+ isolation.
- Additionally, it also reduces substrate noise coupling.
Sunday, August 30, 2020
Submicron, Deep Submicron, Ultra Deep Submicron
CMOS Technology Categories:-
- Submicron: L >= 350 nm
- Deep Submicron: 100 nm <= L <= 350 nm
- Ultra Deep Submicron: L <= 100 nm
Source: https://aicdesign.org/
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Why there is a massive chip shortage in the semiconductor industry?
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Isolation technique to prevent current leakage between adjacent semiconductor device. Hence, prevents latch-up. MOSFET's are also called...